記事・論文
| Title | Electron microscopic and diffraction study of silicon oxide film |
|---|---|
| Author | Sugata E |
| Place of Publication (Country Code) | JP |
| Place of Publication | 東京 |
| Publisher | 日本電子顕微鏡学会 |
| Date | 10(1) 1961.04 |
| Year of Publication(W3CDTF) | 1961-04 |
| NDLC | ZN33 |
| Target Audience | 一般 |
| Material Type | 記事・論文 |
| is part of (URI Form) | https://iss.ndl.go.jp/books/R100000002-I000000015810-00 |
| is part of (ISSN Form) | 00220744 |
| is part of (ISSN-L Form) | 00220744 |
| Magazine-which-carries-the-article name | 電子顕微鏡学会誌 |
| Printing volume | 10 |
| Printing number | 1 |
| Printing page | ???? |
