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Format 記事・論文

Analytical model of the trap-density-dependent programming characteristics of MONOS memories and its application to a MONS memory

野本 和正,藤原 一郎,青笹 浩 他

details

Title Analytical model of the trap-density-dependent programming characteristics of MONOS memories and its application to a MONS memory
Author 野本 和正
Author 藤原 一郎
Author 青笹 浩 他
Place of Publication (Country Code) JP
Parallel Title MONOSメモリのトラップ密度に依存したプログラム特性の解析モデルとMONSメモリへの応用
Year of Publication(W3CDTF) 2002-01-22
Subject Heading(Keyword) MONOSメモリ
Subject Heading(Keyword) 窒化膜
Subject Heading(Keyword) トラップ
Subject Heading(Keyword) Si-H結合
Subject Heading(Keyword) プログラム特性
Subject Heading(Keyword) トンネリング
Subject Heading(Keyword) MONOS memory
Subject Heading(Keyword) nitride
Subject Heading(Keyword) trap
Subject Heading(Keyword) Si-H bond
Subject Heading(Keyword) programming characteristics
Subject Heading(Keyword) tunneling
NDLC ZN33
Target Audience 一般
Material Type 記事・論文
is part of (URI Form) https://iss.ndl.go.jp/books/R100000002-I000000050569-00
is part of (ISSN Form) 09135685
is part of (ISSN-L Form) 09135685
Magazine-which-carries-the-article name 電子情報通信学会技術研究報告 : 信学技報
Printing volume 101
Printing number 573
Printing page 49~54
Language(ISO639-2 Form) eng : English

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