記事・論文
| Title | VLSIのテストと高信頼性 |
|---|---|
| Author | 樹下 行三 |
| Series | システムにおける安全性と高信頼性<特集> |
| Place of Publication (Country Code) | JP |
| Place of Publication | 東京 |
| Publisher | 計測自動制御学会 |
| Date | 24(4) 1985.04 |
| Year of Publication(W3CDTF) | 1985-04 |
| NDLC | ZM11 |
| Target Audience | 一般 |
| Material Type | 記事・論文 |
| is part of (URI Form) | https://iss.ndl.go.jp/books/R100000002-I000000006579-00 |
| is part of (ISSN Form) | 04534662 |
| is part of (ISSN-L Form) | 04534662 |
| Magazine-which-carries-the-article name | 計測と制御 : journal of the Society of Instrument and Control Engineers |
| Printing volume | 24 |
| Printing number | 4 |
| Printing page | p313～318 |
| Language（ISO639-2 Form) | jpn : 日本語 |
