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紙図書
国立国会図書館
- 要約等...als of optical metrology for precision engineering. The next-gen...... presented, making it an essenti......for various engineering fields."--
- 内容細目...oder Chapter 5 In-line and on-machine surface profi......n of scale grating Chapter 7 Ult......l comb applied metrology
- 件名Optical measurements Metrology Mesures optiques Métrologie
紙図書
国立国会図書館
- 一般注記...ference, Modelling Aspects in Optical Metrology 2019, was orga......e SPIE Optical Metrology symposium, which ..."--Introduction.
- 並列タイトル等（連結）Modeling aspects in optical metrology 7 : 24-26 June......, Germany Modeling aspects in optical metrology VII : at SPIE optical metrology : 24-26 June 2019 : Munich, G...
- 並列タイトル等Modeling aspects in optical metrology 7 : 24-26 June......, Germany Modeling aspects in optical metrology VII : at SPIE optical metrology : 24-26 June 2019 : Munich, G...
紙図書
国立国会図書館
- 内容細目Chaos in laser systems ......tical feedback in semiconductor ......dback Dynamics in semiconductor ......s with optical injection Dynamic......and modulation Instability and chaos in various laser ......nductor lasers Metrology based on chaot......ynchronization in semiconductor ......communications in semiconductor ......s and photonic integrated circuits for chaotic ...
- タイトル標目Springer series in optical sciences ; v. 111. 03...
紙図書
国立国会図書館
- 並列タイトル等（連結）Modeling aspects in optical metrology 8 : 21-25 June 2021 : online only, Germany Modeling aspects in optical metrology VIII : at SPIE optical metrology : 21-25 June 2021 : online only, Germany
- 並列タイトル等Modeling aspects in optical metrology 8 : 21-25 June 2021 : online only, Germany Modeling aspects in optical metrology VIII : at SPIE optical metrology : 21-25 June 2021 : online only, Germany
紙図書
国立国会図書館
- 並列タイトル等（連結）Modeling aspects in optical metrology 6 : 26-28 June 2017 : Munich, Germany SPIE. optical metrology
- 並列タイトル等Modeling aspects in optical metrology 6 : 26-28 June 2017 : Munich, Germany SPIE. optical metrology
紙図書
国立国会図書館
- 並列タイトル等（連結）...t: the extraordinaire in optical metrology and optics education : at......PIE optical engineering + applications : 2-3 August ...
- 並列タイトル等...t: the extraordinaire in optical metrology and optics education : at......PIE optical engineering + applications : 2-3 August ...
紙図書
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- 内容細目Quantum Communication Quantum Information Theor......ki Takesue 著 Spin-Photon Entanglement in Semiconductor ......moto 著 Quantum Metrology and Sensing Optical Latti...... and Frequency Metrology Masao Takamoto...... Metrologies Using Photons Shige......akeuchi 著 Counting Statistics of Single-Electron Tr......Coherent Computing Some Recent P......Coherent Computing with Injection-Locked ......著 A Coherent Ising Machine for MAX-CUT P......mulation Bose-Einstein Condensation Y......m Simulation Using Ultracold Ytterbium Atoms in an Optical Lat......Trapped Ions Shinji Urabe, Kenji......m Condensation in Driven-Dissipative Semiconduc...
- 関連情報Lecture notes in physics
- 掲載誌Lecture notes in physics
紙図書
国立国会図書館
- 並列タイトル等（連結）Advances in metrology for X-ray and EUV optics 9 : 24 August-......mber 2020 : online only, Califor......tates Advances in metrology for X-ray and EUV optics IX : at SPIE optical engineering + application......mber 2020 : online only, California, United Sta...
- 並列タイトル等Advances in metrology for X-ray and EUV optics 9 : 24 August-......mber 2020 : online only, Califor......tates Advances in metrology for X-ray and EUV optics IX : at SPIE optical engineering + application......mber 2020 : online only, California, United Sta...
紙図書
国立国会図書館
- 並列タイトル等（連結）Advances in metrology for X-ray and EUV optics 8 : 11-12 Augu......tates Advances in metrology for X-ray and EUV optics VIII : at SPIE optical engineering + applications : 11-12 Augus...
- 並列タイトル等Advances in metrology for X-ray and EUV optics 8 : 11-12 Augu......tates Advances in metrology for X-ray and EUV optics VIII : at SPIE optical engineering + applications : 11-12 Augus...
紙図書
国立国会図書館
- ジャンル・形式用語Conference papers and proceedings.
- 件名...s--Congresses. Integrated circui......n--Congresses. Integrated circuits. Optical mea...
- 並列タイトル等（連結）Modeling aspects in optical metrology 5 : 23-25 June 2015 : Munich, Germany SPIE. optical metrology
紙図書
国立国会図書館全国の図書館
- 内容細目Overview of optical sensing / José Luís S......amarz Farahi Principles of optical metrology / Angela Davie...... Bishnu P. Pal Intensity measurements: Principles and tech......Carmen Vázquez Interferometric measurement: principles and tech......measurement: principles and tech......measurement: principles and tech......n Jha Adaptive optics and wavefront sensing / Robert K. T......ert Edward Imaging based on opti......ried Fiber sensing: a historic o......N. Petrovich Point sensors: intensity sensors......uel Baptista Point sensors: interferometric s......ensor multiplexing principles / Geoffr......n light scattering in optical fibers / Xiaoyi B...
紙図書
国立国会図書館
- 並列タイトル等（連結）Advances in metrology for X-ray and EUV optics 7 : 6-7 August......d States SPIE. optics + photonics
- 並列タイトル等Advances in metrology for X-ray and EUV optics 7 : 6-7 August......d States SPIE. optics + photonics
紙図書
国立国会図書館
- 並列タイトル等（連結）Advances in metrology for x-ray and EUV optics 6 : 29 August ......d States SPIE. optics + photonics
- 並列タイトル等Advances in metrology for x-ray and EUV optics 6 : 29 August ......d States SPIE. optics + photonics
紙図書
国立国会図書館全国の図書館
- 要約等...l power. Featuring contributors from industry and acad......ications. Covering scales ranging from nanomete......presents the principles, techniq......d devices used in modern optical dimensional metrology. An essential ......logists and engineers, the book incorporates data tables and a m...
- 件名...ECHNOLOGY & ENGINEERING / Lasers & Ph......ECHNOLOGY & ENGINEERING / Sensors
- 関連情報Series in optics and optoelectronics
紙図書
国立国会図書館
- 要約等Part I introduces the basic "Principles and Meth......urement" according to a classification into a dozen of f......es: resistive, inductive, capaci......effect), vibrating wires, (micro......ues and to combined methods in force measurem......sses the "(Strain Gauge) Force T......ponents", evolving from the clas...... the digital / intelligent one, with the incorporation of ......omechanics and informatics). The......asically determines its performa......n or tube, bending beam, bending and/or torsio......hear beam, bending ring, yoke or fram......rical and voluminous EE), with e......ace of the strain gauges. The main properties o...
- 内容細目The International Sys......ace of "Force" in European, Asia......haracteristics in the Measuremen...... with Examples in Weighing Cells General...... Methods and Principles for Measuring Mechanical Qu......ptical Methods in Small Force Sensing Strain Gauges Resistive and Other Principles Wheatsto......olution of Strain Gauge Force Tr......brication, Testing, Calibration ...... Databases Testing Equipment to Investigate Elast......amic Stiffness in Connection wit......l Screws and Reinforced Concrete......eans for Measuring Cables Tensio......eakers when Acting A New Weigh-in-Motion and Traffic Monitoring System Robotic and Biomedica...
- 件名Transducers. Machinery. Mechatronics.
紙図書
国立国会図書館
- 件名...esses. Optical instruments--Desi......gresses. Measuring instruments--Desi......gresses. Laser interferometers--......t--Congresses. Metrology EUV optics
- 並列タイトル等（連結）Advances in metrology for x-ray and EUV optics 5 : 18 August ......d States SPIE. optics + photonics
- 並列タイトル等Advances in metrology for x-ray and EUV optics 5 : 18 August ......d States SPIE. optics + photonics
紙記事
国立国会図書館全国の図書館
- 並列タイトル等（連結）Optical Metrology Based on Novel Features in Optical Comb
- 並列タイトル等Optical Metrology Based on Novel Features in Optical Comb
紙図書
国立国会図書館
- 要約等...addresses emerging and future te......tions. Envisioning a future comp......e authors take inspiration from ......ynman Roadmap" instead of the "M......admap. The sharing of the author's industrially prov...... and manufacturing, along with t...... to jump ahead in their understanding of the core of the topic in a very effecti......esearchers, engineers, and technologists involved in silicon-based ......elopment will find a wealth of u......and groundbreaking information in this book."--Cover page 4
- 内容細目...Igor Varisco Thin film depositio......, Andrea Nomellini Thin films characterization and metrology / Paolo Ferrarini, Luca Lamagna......erti, Marco Salina, Martina Scolari, Lore......e / Maria Carolina Turi, Ilaria ......ardo Gianola, Linda Montagna Wet etching and cleaning / Gianluca Lo......de Assanelli, Cinzia De Marco Pi......o, Paolo Ferrarini, Claudia Pedrini, Angela Cimmino, Lorenzo Vinciguerra, Miche......r-to-wafer bonding / Laura Oggio......MEMS sensors. Linear and nonlinear mechanics in MEMS / Claudia...... Frangi, Valentina Zega Inertial sensors ......o, Carlo Valzasina Magnetometers......o, Fabrizio Cerini, Federico Vercesi Pressure s...
紙デジタル記事
インターネットで読める国立国会図書館全国の図書館
- 要約等<p>Modern industry and scie...... optical measuring systems and l...... optical measuring systems and t......tem for the 3D inspection of cer......er templates using diffractive optics is presented f......r are given. Using a perfectly s......newest results in the field of l......ge generator using the semicondu......ted. The measuring systems and t......s and are used in different branches of industry and science.</p>
- 件名3D optical inspection nano profilometer pic...
- 参照Defect Detection in Multiple Product Variants Using Hammering Test with Machine Learning
紙デジタル記事
インターネットで読める国立国会図書館全国の図書館
- 要約等<p>At the National Institute of Metrology (NIM), China, the Small Angle Measuring System, which...... based on the sine principle, was deve......he plane angle in an angular measuring range of ±5°.......urement uncertainty of this system is dominated by the accuracy of an invar angular interferometer op......ate this angle interferometer sy......-step method using a double-deck......urement uncertainty of the calibration is estim...
- 件名angle measurement angle interferometer calibration multi...
- 参照Uncertainty analysis for......calibrations using circle closur......Advanced Angle Metrology System High pr......collimators against an angle com......utocollimators in deflectometry Capabilities an...