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Science reports of the Research Institutes, Tohoku University Ser. A Physics, Chemistry and Metallurgy

紙雑誌

Institute for Materials Research, Tohoku University1949-1997<Z53-A406>

国立国会図書館全国の図書館

New Method for Observation of Interface States in the Semiconductor Band-Gap : XPS Measurements under Biases(Interfaces by various techniques)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.201-206

全国の図書館

掲載誌（ISSN）00408808

Ballistic-Electron-Emission Microscopy at Epitaxial Metal/Semiconductor Interfaces(STM-BEEM interfaces)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.157-163

全国の図書館

掲載誌（ISSN）00408808

Clustering and Precipitation Processes in Microalloyed Aluminium Alloys(APFIM/FIM)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.241-251

全国の図書館

掲載誌（ISSN）00408808

High Resolution Field Emission Spectra from Niobium (100) Tip Surface(APFIM/FIM)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.257-260

全国の図書館

掲載誌（ISSN）00408808

Semiconductor Interface Structure Studied by X-Ray Diffraction(Interfaces by various techniques)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.195-199

全国の図書館

掲載誌（ISSN）00408808

Hard Magnetic Properties of Bulk Amorphous Alloys(Nano-materials)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.261-269

全国の図書館

掲載誌（ISSN）00408808

Clustering and Precipitation Processes in Microalloyed Aluminium Alloys(APFIM/FIM)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.241-251

全国の図書館

掲載誌（ISSN）00408808

Tip-Sample Capacitance in STM(STM-BEEM interfaces)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.173-179

全国の図書館

掲載誌（ISSN）00408808

STM-BEEM interfaces(Divisional title)

デジタル文書・図像類

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学44 2

全国の図書館

掲載誌（ISSN）00408808

SFM-IV Method for Characterizing Sub-Surface Interfaces of Semiconductor Devices(Interfaces by various techniques)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.181-185

全国の図書館

掲載誌（ISSN）00408808

Internal-photoemission Microscopy (IPEM) : Microscopic Characterization Technique for Buried Thick-metal/Semiconductor Interfaces(Interfaces by various techniques)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.187-194

全国の図書館

掲載誌（ISSN）00408808

Scanning Tunneling Microscopy of the GaAs(001) Surface Reconstructions(STM-GaAs)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.113-143

全国の図書館

掲載誌（ISSN）00408808

Field Ion Microscopy of C_<60> Molecules(APFIM/FIM)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.253-256

全国の図書館

掲載誌（ISSN）00408808

Recent Atom Probe Studies at IMR : a Comprehensive Review(APFIM/FIM)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.223-240

全国の図書館

掲載誌（ISSN）00408808

New Method for Observation of Interface States in the Semiconductor Band-Gap : XPS Measurements under Biases(Interfaces by various techniques)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.201-206

全国の図書館

掲載誌（ISSN）00408808

Scanning Tunneling Microscopic Observation of the Atomic Structure of GaAs(001) Surface Grown by Metalorganic Vapor Phase Epitaxy(STM-GaAs)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.149-152

全国の図書館

掲載誌（ISSN）00408808

Scanning Tunneling Microscopic Observation of the Atomic Structure of GaAs(001) Surface Grown by Metalorganic Vapor Phase Epitaxy(STM-GaAs)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.149-152

全国の図書館

掲載誌（ISSN）00408808

Ballistic Electron Emission Microscopy (BEEM) and Spectroscopy of Buried Semiconductor Heterostructures and Quantum Dots(STM-BEEM interfaces)

記事

1997-03-31東北大学研究所報告. A集, 物理学・化学・冶金学 = Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.165-172

全国の図書館

掲載誌（ISSN）00408808

SFM-IV Method for Characterizing Sub-Surface Interfaces of Semiconductor Devices(Interfaces by various techniques)

デジタル記事

1997-03-31Science reports of the Research Institutes, Tohoku University. Ser. A, Physics, chemistry and metallurgy44 2p.181-185

全国の図書館

掲載誌（ISSN）00408808