並列タイトル等Programmable reverse bias safe operating area transistor tester
一般注記Distributed to depository libraries in microfiche
Shipping list no.: 92-1526-M
Paper version no longer for sale by the Supt. of Docs
"August 1990."
"CODEN: NSPUE2"--T.p. verso
Physical description for original version: iv, 54 p. : 28 cm
書誌注記Includes bibliographical references (p. 54)
原資料等に関する注記原資料の出版事項: Gaithersburg, MD ; [Springfield, VA : U.S. Dept. of Commerce, National Institute of Standards and Technology : Order from National Technical Information Service], 1990
SUPTDOC番号: C 13.10: 400-87
GPO管理番号: 0247 (MF)