検索結果 3 件

デジタル記事
2004-02IEEE Computer Society Symposium on VLSIp.179-184
インターネットで読める全国の図書館
  • 要約等In testing system-on-a-chip (SOC), external pins for test are getting mo......uild SOCs, are tested via test access mechani......AMs) such as a test bus architecture. When cores are tested via TAMs, test stimuli and test responses for cores have to ......rialization of test patterns. It i......usage of TAMs. Test scheduling sho......r, a novel and practical test architecture optimization is proposed such that test time is minimized with floorplanning constraints abided. In thi......mputation time for the optimization can be alleviated by floorplanning manipulation. ......esults to this optimization are shown to validate this pr...
デジタル記事
杉原, 真, 村上, 和彰, 松永, 裕介IEEE Computer Society2004-02IEEE Computer Society Symposium on VLSIp.179-184
インターネットで読める全国の図書館

検索結果は以上です。