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Ultrahigh-quality Silicon Carbide Single Crystals (Special Issue: Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices)

Ultrahigh-quality Silicon Carbide Single Crystals (Special Issue: Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices)
デジタル記事
中村 大輔, 郡司島 造, 山口 聡 他<Z16-948>豊田中央研究所R&Dレビュー = R&D review of Toyota CRDL / R&Dレビュー編集委員会 編41(2) 2006.6p.5～10
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  • 件名Semiconductor Silicon carbide Single crystal Power device Crystal ...

Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices (Special Issue: Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices)

Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices (Special Issue: Processing Design of Single Crystals and Textured Polycrystals for Advanced Electronic Devices)
デジタル記事
谷 俊彦<Z16-948>豊田中央研究所R&Dレビュー = R&D review of Toyota CRDL / R&Dレビュー編集委員会 編41(2) 2006.6p.1～4
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  • 件名...cessing design Single crystal Silicon carbide Textu...

Single-electron stochastic resonance using Si nanowire transistors (Special issue: Microprocesses and nanotechnology)

Single-electron stochastic resonance using Si nanowire transistors (Special issue: Microprocesses and nanotechnology)
紙記事
Katsuhiko Nishiguchi, Akira Fujiwara<Z53-A375>Japanese journal of applied physics : JJAP50(6) (2) 2011.6p.06GF04-1～5
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Characterization of LiNbO3 single-crystal substrates irradiated with electrons (Special issue: Ultrasonic electronics)

Characterization of LiNbO3 single-crystal substrates irradiated with electrons (Special issue: Ultrasonic electronics)
紙デジタル記事
Hisashi Miyazaki, Jun Morimoto, Kohji Toda 他<Z53-A375>Japanese journal of applied physics : JJAP50(7) (2) 2011.7p.07HB07-1～4
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  • 要約等...>3</jats:sub>) single crystals have been investigat...
  • 参照...ithium niobate single crystals Nonst......ometric LiNbO3 single crystals Generation of small ...

An RSA encryption hardware algorithm using a single DSP block and a single Block RAM on the FPGA (Special issue on selected papers from the first International Conference Networking and Computing)

An RSA encryption hardware algorithm using a single DSP block and a single Block RAM on the FPGA (Special issue on selected papers from the first International Conference Networking and Computing)
紙デジタル記事
Song Bo, Kensuke Kawakami, Koji Nakano 他<Z78-A690>International journal of networking and computing1(2) 2011.7p.277～289
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Fabrication of focus-variable fluidic microlens using single casting (Special issue: Microprocesses and nanotechnology)

Fabrication of focus-variable fluidic microlens using single casting (Special issue: Microprocesses and nanotechnology)
紙記事
Trung-Dung Dang, Cheol-Woo Park, Gyu-Man Kim<Z53-A375>Japanese journal of applied physics : JJAP50(6) (2) 2011.6p.06GM15-1～6
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Direct Reaction Probes of Single-Particle States and Correlations(YKIS2011 papers,Frontier Issues in Physics of Exotic Nuclei)

書影書影書影
Direct Reaction Probes of Single-Particle States and Correlations(YKIS2011 papers,Frontier Issues in Physics of Exotic Nuclei)
デジタル記事障害者向け資料あり
TOSTEVIN,J. A.Progress of Theoretical Physics2012-10-22Progress of theoretical physics. Supplement(196)p.275-282
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Image-based identification of single neurons for noninvasive imaging purification (Special issue: Microprocesses and nanotechnology)

Image-based identification of single neurons for noninvasive imaging purification (Special issue: Microprocesses and nanotechnology)
紙記事
Hideyuki Terazono, Masahito Hayashi, Hyonchol Kim 他<Z53-A375>Japanese journal of applied physics : JJAP50(6) (2) 2011.6p.06GL07-1～4
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Reliability design for neutron induced single-event burnout of IGBT (Special issue on "IPEC-Sapporo 2010")

Reliability design for neutron induced single-event burnout of IGBT (Special issue on "IPEC-Sapporo 2010")
紙デジタル記事
Tomoyuki Shoji, Shuichi Nishida, Toyokazu Ohnishi 他<Z16-1608>電気学会論文誌. D, 産業応用部門誌 = IEEJ transactions on industry applications131(8) 2011.8p.992～999
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  • 要約等Single-event burnout (SEB) caused by...
  • 件名single-event burnout (SEB) of IGBT w...
  • 参照...eutron Induced Single-Event Burnout ......eutron-induced single-event burnout in SiC power di...

Fabrication of metal embedded nano-cones for single quantum dot emission (Special issue: Microprocesses and nanotechnology)

Fabrication of metal embedded nano-cones for single quantum dot emission (Special issue: Microprocesses and nanotechnology)
紙デジタル記事
Jae-Hoon Huh, Claus Hermannstadter, Kouichi Akahane 他<Z53-A375>Japanese journal of applied physics : JJAP50(6) (2) 2011.6p.06GG02-1～5
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  • 要約等...d detection of single and entangled ......emitted from a single QD as a result of embedding o...

Single nucleotide polymorphism mapping and alignment of recombinant chromosome substitution lines in barley (Special issue articles: Barley)

Single nucleotide polymorphism mapping and alignment of recombinant chromosome substitution lines in barley (Special issue articles: Barley)
紙記事
Kazuhiro Sato, Timothy J. Close, Prasanna Bhat 他<Z53-C97>Plant and cell physiology52(5) 2011.5p.728～737
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  • 件名Barley Expressed sequence tag Hordeum vulgare Mapping Single nucleotide polymorphism

A theoretical study of a novel single-electron refrigerator fabricated from semiconductor materials (Special issue: Microprocesses and nanotechnology)

A theoretical study of a novel single-electron refrigerator fabricated from semiconductor materials (Special issue: Microprocesses and nanotechnology)
紙デジタル記事
Hiroya Ikeda, Faiz Salleh<Z53-A375>Japanese journal of applied physics : JJAP50(6) (2) 2011.6p.06GF20-1～4
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  • 要約等...ropose a novel single-electron refri...... consists of a single-electron box and a single-electron pump ......cts successful single-electron extraction and injec...
  • 参照Single-electron trans...... the DC SQUIDS Single electron pump ......r Device Using Single-Electron Pump ......adio-Frequency Single-Electron Refrigerator Opportu...

Measurement of the resonant characteristics of a single bubble vibration by using a laser Doppler vibrometer (Special issue: Ultrasonic electronics)

Measurement of the resonant characteristics of a single bubble vibration by using a laser Doppler vibrometer (Special issue: Ultrasonic electronics)
紙記事
Taisuke Yoshikawa, Hironori Kotera, Kenji Yoshida 他<Z53-A375>Japanese journal of applied physics : JJAP50(7) (2) 2011.7p.07HE04-1～3
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Microholographic recording using single-sided optics with electrical beam control (Special issue: Optical memories)

Microholographic recording using single-sided optics with electrical beam control (Special issue: Optical memories)
デジタル記事
Ryuichi Katayama, Yuichi Komatsu, Masanao Natsumeda<Z53-A375>Japanese journal of applied physics : JJAP49(8) (3) 2010.8p.08KF02-1～6
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SiNx double layer antireflection coating by plasma-enhanced chemical vapor deposition for single crystalline silicon solar cells (Special issue: Dry process)

SiNx double layer antireflection coating by plasma-enhanced chemical vapor deposition for single crystalline silicon solar cells (Special issue: Dry process)
紙記事
Daeyeong Gong, Youn-Jung Lee, Minkyu Ju 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (3) 2011.8p.08KE01-1～5
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Single-electron transport through semiconducting nanowires: a comparison between silicon and germanium (Special issue: Solid state devices and materials)

Single-electron transport through semiconducting nanowires: a comparison between silicon and germanium (Special issue: Solid state devices and materials)
紙記事
Sung-Kwon Shin, Shaoyun Huang, Naoki Fukata 他<Z53-A375>Japanese journal of applied physics : JJAP50(4) (2) 2011.4p.04DN06-1～4
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Single-electron charging in phosphorus donors in silicon observed by low-temperature Kelvin probe force microscope (Special issue: Scanning probe microscopy)

Single-electron charging in phosphorus donors in silicon observed by low-temperature Kelvin probe force microscope (Special issue: Scanning probe microscopy)
紙デジタル記事
Miftahul Anwar, Yuya Kawai, Daniel Moraru 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB10-1～4
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  • 要約等...n the channel. Single-step changes i......re ascribed to single-electron charg......ually, without single-step behavior, as the backgat...
  • 参照...e Placement of Single Dopants in Si ......ces in Silicon Single-donor ionizati......e CMOS channel Single-Electron Trans......lication to Si single-electron devic......ransition of a single dopant atom in......ies in silicon Single-Electron Transport through Single Dopants in a D...... ionization of single dopant atoms Q......rce microscopy Single-electron trans......ctroscopy of a Single Dopant in a Ga......math>Interface Single‐photon detection by Si single‐electron FETs ......dispersion for single-electron turnstile operation ...

Preparation of single-phase Pb-filled Chevrel-phase sulfide and its thermoelectric properties (Special issue on thermoelectric conversion materials (6))

Preparation of single-phase Pb-filled Chevrel-phase sulfide and its thermoelectric properties (Special issue on thermoelectric conversion materials (6))
紙デジタル記事
Hirotaka Nishiate, Michihiro Ohta, Atsushi Yamamoto 他<Z53-J286>Materials transactions52(8) 2011.8p.1535～1538
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  • 要約等...B>2</SUB>. The single phase was formed in the nomin...
  • 件名thermoelectric materials single phase Chevrel-phase sulfides ...

Improving single-chamber solid oxide fuel cell performance by plasma treatment using an atmospheric-pressure helium plasma jet (Special issue: Dry process)

Improving single-chamber solid oxide fuel cell performance by plasma treatment using an atmospheric-pressure helium plasma jet (Special issue: Dry process)
紙記事
Seiji Kanazawa, Tadasuke Iwao, Shuichi Akamine 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (3) 2011.8p.08KA04-1～5
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Solution-processed small molecular organic light-emitting devices with a mixed single layer (Special issue: Nano electronic materials)

Solution-processed small molecular organic light-emitting devices with a mixed single layer (Special issue: Nano electronic materials)
紙記事
Zhaokui Wang, Shigeki Naka, Hiroyuki Okada<Z53-A375>Japanese journal of applied physics : JJAP50(1) (3) 2011.1p.01BC06-1～3
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