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Study of initial growth layer of GaSb on Si(111) by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Study of initial growth layer of GaSb on Si(111) by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
紙記事
Shinsuke Hara, Kazuhiro Fuse, Ryuto Machida 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB03-1～6
国立国会図書館全国の図書館

Photoabsorption properties in InAs wire structures investigated by dual light illumination method in scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Photoabsorption properties in InAs wire structures investigated by dual light illumination method in scanning tunneling microscopy (Special issue: Scanning probe microscopy)
紙記事
Shuichi Katsui, Takuji Takahashi<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB08-1～4
国立国会図書館全国の図書館

In situ observation of surface reconstruction of Si(001) with stress/strain field scanning probe microscopy (Special issue: Scanning probe microscopy)

In situ observation of surface reconstruction of Si(001) with stress/strain field scanning probe microscopy (Special issue: Scanning probe microscopy)
紙デジタル記事
Guo Hongxuan, Daisuke Fujita<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB04-1～4
国立国会図書館全国の図書館
  • 要約等...s/strain field scanning probe microscopy (SF-SPM). This......be operated as scanning tunneling microscope (STM) or...
  • 参照...f atomic force microscopy combined with scanning electron microscopy for investigating electronic ...
  • 参照...y atomic force microscopy Effect of Surf......t Atomic Force Microscopy at 5 K High-re...... surface using scanning tunneling microscopy Plasticity stu......> atomic force microscopy Elastic effect......y atomic force microscopy Finite-tempera......confocal Raman microscopy Effect of static uniaxial str...

Scanning microscopies 2014 : 16-18 September 2014 : Monterey, California, United States : SPIE scanning microscopies 2014 symposium (conference 9236) : "microscopy for STEM educators" workshop : Sep 2014, Monterey, CA. (SPIE Proceedings ; 9236)

Scanning microscopies 2014 : 16-18 September 2014 : Monterey, California, United States : SPIE scanning microscopies 2014 symposium (conference 9236) : "microscopy for STEM educators" workshop : Sep 2014, Monterey, CA. (SPIE Proceedings ; 9236)
紙図書
SPIE[2014]<M17-15-329>
国立国会図書館
  • 並列タイトル等（連結）SPIE. scanning microscopies
  • 並列タイトル等SPIE. scanning microscopies

Study of Ga adsorption structure on Ni/Si(100) surface by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Study of Ga adsorption structure on Ni/Si(100) surface by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
デジタル記事
Shinsuke Hara, Kazuhiro Fuse, Toru Suzuki 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB03-1～5
インターネットで読める国立国会図書館全国の図書館

Scanning microscopies 2015 : 29 September-1 October 2015 : Monterey, California, United States : Sep 2015, Monterey, CA. (SPIE Proceedings ; 9636)

Scanning microscopies 2015 : 29 September-1 October 2015 : Monterey, California, United States : Sep 2015, Monterey, CA. (SPIE Proceedings ; 9636)
紙図書
SPIE[2015]<M17-16-458>
国立国会図書館
  • 件名Scanning electron microscopes--Congresses. Scanning electron microscopes.
  • 並列タイトル等（連結）SPIE. scanning microscopies
  • 並列タイトル等SPIE. scanning microscopies

Scanning tunneling microscopy study of in situ hydrogenation of Si(110) surface (Special issue: Scanning probe microscopy)

Scanning tunneling microscopy study of in situ hydrogenation of Si(110) surface (Special issue: Scanning probe microscopy)
デジタル記事
Anton Visikovskiy, Masamichi Yoshimura, Kazuyuki Ueda<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB05-1～5
インターネットで読める国立国会図書館全国の図書館

Scanning probe microscopy for identifying the component materials of a nanostripe structure (Special issue: Scanning probe microscopy)

Scanning probe microscopy for identifying the component materials of a nanostripe structure (Special issue: Scanning probe microscopy)
デジタル記事
Akira Mizuno, Yasuhisa Ando<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB07-1～7
インターネットで読める国立国会図書館全国の図書館

Theoretical study of moire pattern in scanning tunneling microscopy images of carbon nanotubes on metallic substrate (Special issue: Scanning probe microscopy)

Theoretical study of moire pattern in scanning tunneling microscopy images of carbon nanotubes on metallic substrate (Special issue: Scanning probe microscopy)
デジタル記事
Seiji Takemoto, Nobuhiko Kobayashi<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB02-1～3
インターネットで読める国立国会図書館全国の図書館

Theoretical simulation of scanning probe microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)

Theoretical simulation of scanning probe microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)
紙デジタル記事
Masaru Tsukada<Z54-F482>Analytical Sciences27(2) (通号 225) 2011.2p.121～127
国立国会図書館全国の図書館
  • 要約等... simulation of scanning probe microscopy, including scanning tunneling microscopy (STM), atomic force microscopy(AFM) and Kelvin prove force microscopy (KPFM) have been reviewed wit...
  • 参照...n Atomic Force Microscopy
  • 参照...in-Probe Force-Microscopy Imaging of Sem......in probe force microscopy on thin insula......t Atomic Force Microscopy Non-contact Atomic Force Microscopy Simulations of......g atomic force microscopy Understanding ......in Probe Force Microscopy Self-consisten......in probe force microscopy Tip-sample int......in probe force microscopy On the relevan......in probe force microscopy Theory of Non-......t Atomic Force Microscopy Mechanical per......Simulations of Scanning Probe Microscopy for Organic an......t atomic force microscopy in liquids Non......t atomic force microscopy observation of......u(111) surface Scanning Tunneling Microscopy III A th...

Initial stages of platinum silicide formation on Si(110) studied by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Initial stages of platinum silicide formation on Si(110) studied by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
デジタル記事
Anton Visikovskiy, Masamichi Yoshimura, Kazuyuki Ueda<Z53-A375>Japanese journal of applied physics : JJAP48(8) (3) 2009.8p.08JB11-1～4
インターネットで読める国立国会図書館全国の図書館

Low-temperature scanning tunneling microscopy investigation of tris(phthalocyaninato)yttrium triple-decker molecules deposited on Au(111) (Special issue: Scanning probe microscopy)

Low-temperature scanning tunneling microscopy investigation of tris(phthalocyaninato)yttrium triple-decker molecules deposited on Au(111) (Special issue: Scanning probe microscopy)
デジタル記事
Hironari Isshiki, Jie Liu, Keiichi Katoh 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB11-1～4
インターネットで読める国立国会図書館全国の図書館

Effect of defects buried in pentacene/alkanethiol self-assembled monolayer/Au film on its electronic properties visualized by scanning tunneling microscopy/spectroscopy (Special issue: Scanning probe microscopy)

Effect of defects buried in pentacene/alkanethiol self-assembled monolayer/Au film on its electronic properties visualized by scanning tunneling microscopy/spectroscopy (Special issue: Scanning probe microscopy)
デジタル記事
Yasuhiko Terada, Noriaki Takeuchi, Shoji Yoshida 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB08-1～4
インターネットで読める国立国会図書館全国の図書館

Automatic glitch elimination of scanning probe microscopy images (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)

Automatic glitch elimination of scanning probe microscopy images (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)
紙デジタル記事
Yuhang Chen, Wenhao Huang<Z54-F482>Analytical Sciences27(2) (通号 225) 2011.2p.153～156
国立国会図書館全国の図書館
  • 要約等...appear in many scanning probe microscopy (SPM) images due to transient...
  • 参照High-speed atomic force microscopy for nano-visua...... Maps in Force Microscopy Simplified dri......cterization in scanning probe microsco......dardization of scanning probe microscopy A new method f......onlinearity in scanning probe microsco......d artifacts in scanning probe microscopy images <scp>WS......A software for scanning probe microscopy and a tool for......) atomic force microscopy Submicron Stru......and Near-Field Microscopy Jumping mode scanning force microscopy Bi-stability o......dic grating in scanning probe microscopy drift measurement

Scanning tunneling microscopy observation of sulfur adsorbates on Au(111) at liquid nitrogen temperature (Special issue: Scanning probe microscopy)

Scanning tunneling microscopy observation of sulfur adsorbates on Au(111) at liquid nitrogen temperature (Special issue: Scanning probe microscopy)
デジタル記事
Shu Kurokawa, Yuu Miyawaki, Akira Sakai<Z53-A375>Japanese journal of applied physics : JJAP48(8) (3) 2009.8p.08JB12-1～5
インターネットで読める国立国会図書館全国の図書館

Dual light illumination method in scanning tunneling microscopy for photoinduced current measurements on InAs wires (Special issue: Scanning probe microscopy)

Dual light illumination method in scanning tunneling microscopy for photoinduced current measurements on InAs wires (Special issue: Scanning probe microscopy)
デジタル記事
Shuichi Katsui, Takuji Takahashi<Z53-A375>Japanese journal of applied physics : JJAP48(8) (3) 2009.8p.08JB03-1～5
インターネットで読める国立国会図書館全国の図書館

Ultra-fast spectrometric cathodoluminescence scanning microscopy for materials analysis (Special issue on development and fabrication of advanced materials assisted by nanotechnology and microanalysis)

Ultra-fast spectrometric cathodoluminescence scanning microscopy for materials analysis (Special issue on development and fabrication of advanced materials assisted by nanotechnology and microanalysis)
紙デジタル記事
Hiroshi Saijo, Makoto Shiojiri<Z53-J286>Materials transactions51(2) 2010.2p.231～236
国立国会図書館全国の図書館
  • 要約等...a conventional scanning electron microscope. The CL s...
  • 件名cathodoluminescence microscopy scanning microscopy cathodoluminescence spectrosc...
  • 参照...doluminescence Microscopy Cathodolumines......doluminescence scanning electron microscopy observations o......cence electron microscopy to biomedical field: I. Vitam...

Atomic structure of Si(553) surface revealed by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Atomic structure of Si(553) surface revealed by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
デジタル記事
Shinsuke Hara, Masamichi Yoshimura, Kazuyuki Ueda<Z53-A375>Japanese journal of applied physics : JJAP47(7) (3) 2008.7p.6102～6104
インターネットで読める国立国会図書館全国の図書館
  • 件名scanning tunneling microscopy high index surface Si(553) fa...
  • 参照...gh-temperature scanning-tunneling-microscopy observation of...... atom-tracking scanning tunneling microscopy Atomically acc......ace studied by scanning tunneling microscopy Orientation an......ET's Real-time scanning tunneling microscopy of phase transition and facet...

Standardization of excitation efficiency in near-field scanning optical microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)

Standardization of excitation efficiency in near-field scanning optical microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)
紙デジタル記事
Tadashi Mitsui, Yasutaka Imanaka, Kanji Takehana 他<Z54-F482>Analytical Sciences27(2) (通号 225) 2011.2p.139～142
国立国会図書館全国の図書館
  • 要約等Near-field scanning optical micros......) is a form of scanning probe microscope (SPM), which...
  • 参照...-field optical-scanning microscopy Development of......-field optical microscopy fabricated by ......hod Near-Field Scanning Fluorescence Microscopy Study of Ion C......obe for photon scanning tunneling microscope Low Temp...

Scanning capacitance microscopy for alkylsilane-monolayer-covered Si substrate patterned by scanning probe lithography (Special issue: Scanning probe microscopy)

Scanning capacitance microscopy for alkylsilane-monolayer-covered Si substrate patterned by scanning probe lithography (Special issue: Scanning probe microscopy)
デジタル記事
Jiwon Han, Kyung-Hwang Lee, Shosuke Fujii 他<Z53-A375>Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP46(8B) (通号 658) (Special Issue) 2007.8p.5621～5625
インターネットで読める国立国会図書館全国の図書館
  • 件名scanning capacitance microscopy SCM self-assem......in-probe force microscopy KFM charge trap nanolithograp...
  • 参照...y Atomic Force Microscopy 長鎖アミノシランを用いて酵素を固定化した拡張ゲート電界効果...
  • 参照...films with the scanning tunneling micr......icon medium by scanning capacitance microscopy Surface potential microscopy for organized ......in probe force microscopy Nanoscopic sur......f-assembly and scanning probe lithogra......cture Based on Scanning Probe Electroc......tes Induced by Scanning Probe Anodizat......g atomic force microscopy: scanning probe electroc......on in soft and scanning probe lithogra......in probe force microscopy Surface Potent......Fabricated via Scanning Probe Lithogra......n atomic force microscopy Proximal probe......sist materials Scanning nonlinear dielectric microscopy with nanometer resolution Gen...