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Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies (Special issue: Scanning probe microscopy)

Development of novel system combining scanning tunneling microscope-based cathodoluminescence and electroluminescence nanospectroscopies (Special issue: Scanning probe microscopy)
紙記事
Kentaro Watanabe, Yoshiaki Nakamura, Shigeyuki Kuboya 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB18-1～4
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Study of initial growth layer of GaSb on Si(111) by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Study of initial growth layer of GaSb on Si(111) by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
紙記事
Shinsuke Hara, Kazuhiro Fuse, Ryuto Machida 他<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB03-1～6
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Scanning tunneling microscope study of surface morphology variation of CeO2(111) with changing annealing condition (Special issue: Scanning probe microscopy)

Scanning tunneling microscope study of surface morphology variation of CeO2(111) with changing annealing condition (Special issue: Scanning probe microscopy)
紙記事
Syed Mohammad Fakruddin Shahed, Yasuyuki Sainoo, Tadahiro Komeda<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB05-1～4
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Scanning electrometer: mapping of electric potential and its fluctuation (Special issue: Scanning probe microscopy)

Scanning electrometer: mapping of electric potential and its fluctuation (Special issue: Scanning probe microscopy)
デジタル記事
Yukio Kawano<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LA02-1～8
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Photoabsorption properties in InAs wire structures investigated by dual light illumination method in scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Photoabsorption properties in InAs wire structures investigated by dual light illumination method in scanning tunneling microscopy (Special issue: Scanning probe microscopy)
紙記事
Shuichi Katsui, Takuji Takahashi<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB08-1～4
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In situ observation of surface reconstruction of Si(001) with stress/strain field scanning probe microscopy (Special issue: Scanning probe microscopy)

In situ observation of surface reconstruction of Si(001) with stress/strain field scanning probe microscopy (Special issue: Scanning probe microscopy)
紙デジタル記事
Guo Hongxuan, Daisuke Fujita<Z53-A375>Japanese journal of applied physics : JJAP50(8) (4) 2011.8p.08LB04-1～4
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  • 要約等...s/strain field scanning probe microsco......be operated as scanning tunneling microscope (STM) or...
  • 参照... combined with scanning electron microscopy for inves...
  • 参照... surface using scanning tunneling microscopy Plastici...

Study of Ga adsorption structure on Ni/Si(100) surface by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Study of Ga adsorption structure on Ni/Si(100) surface by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
デジタル記事
Shinsuke Hara, Kazuhiro Fuse, Toru Suzuki 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB03-1～5
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Scanning tunneling microscopy study of in situ hydrogenation of Si(110) surface (Special issue: Scanning probe microscopy)

Scanning tunneling microscopy study of in situ hydrogenation of Si(110) surface (Special issue: Scanning probe microscopy)
デジタル記事
Anton Visikovskiy, Masamichi Yoshimura, Kazuyuki Ueda<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB05-1～5
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Scanning probe microscopy for identifying the component materials of a nanostripe structure (Special issue: Scanning probe microscopy)

Scanning probe microscopy for identifying the component materials of a nanostripe structure (Special issue: Scanning probe microscopy)
デジタル記事
Akira Mizuno, Yasuhisa Ando<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB07-1～7
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Theoretical study of moire pattern in scanning tunneling microscopy images of carbon nanotubes on metallic substrate (Special issue: Scanning probe microscopy)

Theoretical study of moire pattern in scanning tunneling microscopy images of carbon nanotubes on metallic substrate (Special issue: Scanning probe microscopy)
デジタル記事
Seiji Takemoto, Nobuhiko Kobayashi<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB02-1～3
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酒井健治Scanning Beethovenにおける変容の技法

酒井健治Scanning Beethovenにおける変容の技法
紙記事
伊藤 憲孝<Z11-1293>エリザベト音楽大学研究紀要 = Elisabeth University of Music research bulletin / エリザベト音楽大学研究紀要委員会 編(40):2020p.1-6
国立国会図書館全国の図書館
  • 件名Kenji Sakai Scanning Beethoven
  • 並列タイトル等（連結）Transformation Technique in Scanning Beethoven by Kenji Sakai
  • 並列タイトル等Transformation Technique in Scanning Beethoven by Kenji Sakai

Prism-coupled scanning tunneling microscope light emission spectroscopy of Au film covered with self-assembled alkanethiol monolayer (Special issue: Scanning probe microscopy)

Prism-coupled scanning tunneling microscope light emission spectroscopy of Au film covered with self-assembled alkanethiol monolayer (Special issue: Scanning probe microscopy)
デジタル記事
Jamal Uddin Ahamed, Tomonori Sanbongi, Satoshi Katano 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB09-1～3
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窒素環境におけるScanning Cyclic Pressを用いた純チタンの常温窒化

窒素環境におけるScanning Cyclic Pressを用いた純チタンの常温窒化
紙記事
舩木 優大, 藤村 奈央, 中村 孝, 髙橋 航圭, 和島 達希<Z17-314>日本金属学会誌 = The journal of the Japan Institute of Metals and Materials87(11・12):2023.11・12p.305-308
国立国会図書館全国の図書館
  • 並列タイトル等（連結）Room-Temperature-Nitriding of Pure Titanium Using Scanning Cyclic Press in a Nitrogen En...
  • 並列タイトル等Room-Temperature-Nitriding of Pure Titanium Using Scanning Cyclic Press in a Nitrogen En...

Theoretical simulation of scanning probe microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)

Theoretical simulation of scanning probe microscopy (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)
紙デジタル記事
Masaru Tsukada<Z54-F482>Analytical Sciences27(2) (通号 225) 2011.2p.121～127
国立国会図書館全国の図書館
  • 要約等... simulation of scanning probe microscopy, including scanning tunneling microscopy (STM), a...
  • 参照...Simulations of Scanning Probe Microsco......u(111) surface Scanning Tunneling Micr......ee-Dimensional Scanning Force Microsco......c Processes of Scanning Tunneling Microscopy Effect o...

Low-temperature scanning tunneling microscopy investigation of tris(phthalocyaninato)yttrium triple-decker molecules deposited on Au(111) (Special issue: Scanning probe microscopy)

Low-temperature scanning tunneling microscopy investigation of tris(phthalocyaninato)yttrium triple-decker molecules deposited on Au(111) (Special issue: Scanning probe microscopy)
デジタル記事
Hironari Isshiki, Jie Liu, Keiichi Katoh 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB11-1～4
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Initial stages of platinum silicide formation on Si(110) studied by scanning tunneling microscopy (Special issue: Scanning probe microscopy)

Initial stages of platinum silicide formation on Si(110) studied by scanning tunneling microscopy (Special issue: Scanning probe microscopy)
デジタル記事
Anton Visikovskiy, Masamichi Yoshimura, Kazuyuki Ueda<Z53-A375>Japanese journal of applied physics : JJAP48(8) (3) 2009.8p.08JB11-1～4
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Scanning capacitance microscopy for alkylsilane-monolayer-covered Si substrate patterned by scanning probe lithography (Special issue: Scanning probe microscopy)

Scanning capacitance microscopy for alkylsilane-monolayer-covered Si substrate patterned by scanning probe lithography (Special issue: Scanning probe microscopy)
デジタル記事
Jiwon Han, Kyung-Hwang Lee, Shosuke Fujii 他<Z53-A375>Japanese journal of applied physics. Part. 1, Regular papers, brief communications & review papers : JJAP46(8B) (通号 658) (Special Issue) 2007.8p.5621～5625
インターネットで読める国立国会図書館全国の図書館
  • 件名scanning capacitance microscopy SCM se...
  • 参照...films with the scanning tunneling micr......icon medium by scanning capacitance mi......f-assembly and scanning probe lithogra......cture Based on Scanning Probe Electroc......tes Induced by Scanning Probe Anodizat......ce microscopy: scanning probe electroc......on in soft and scanning probe lithogra......Fabricated via Scanning Probe Lithogra......sist materials Scanning nonlinear diel...... monolayers on scanning probe microsco......ce Microscope. Scanning Capacitance Microscopy as a C...

Effect of defects buried in pentacene/alkanethiol self-assembled monolayer/Au film on its electronic properties visualized by scanning tunneling microscopy/spectroscopy (Special issue: Scanning probe microscopy)

Effect of defects buried in pentacene/alkanethiol self-assembled monolayer/Au film on its electronic properties visualized by scanning tunneling microscopy/spectroscopy (Special issue: Scanning probe microscopy)
デジタル記事
Yasuhiko Terada, Noriaki Takeuchi, Shoji Yoshida 他<Z53-A375>Japanese journal of applied physics : JJAP49(8) (4) 2010.8p.08LB08-1～4
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Automatic glitch elimination of scanning probe microscopy images (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)

Automatic glitch elimination of scanning probe microscopy images (A special issue on advances in scanning probe microscopies for nanomaterial analyses: from basic science to quantitative nanofunctionality analyses)
紙デジタル記事
Yuhang Chen, Wenhao Huang<Z54-F482>Analytical Sciences27(2) (通号 225) 2011.2p.153～156
国立国会図書館全国の図書館
  • 要約等...appear in many scanning probe microscopy (SPM) images...
  • 参照...cterization in scanning probe microsco......dardization of scanning probe microsco......onlinearity in scanning probe microsco......d artifacts in scanning probe microsco......A software for scanning probe microsco......y Jumping mode scanning force microsco......dic grating in scanning probe microscopy drift measur...

Scanning tunneling microscopy observation of sulfur adsorbates on Au(111) at liquid nitrogen temperature (Special issue: Scanning probe microscopy)

Scanning tunneling microscopy observation of sulfur adsorbates on Au(111) at liquid nitrogen temperature (Special issue: Scanning probe microscopy)
デジタル記事
Shu Kurokawa, Yuu Miyawaki, Akira Sakai<Z53-A375>Japanese journal of applied physics : JJAP48(8) (3) 2009.8p.08JB12-1～5
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