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Electron microscopy studies of non-local effects' impact on cathodoluminescence of semiconductor laser structures (Special issue on new trends for micro- and nano analyses by transmission electron microscopy)

Electron microscopy studies of non-local effects' impact on cathodoluminescence of semiconductor laser structures (Special issue on new trends for micro- and nano analyses by transmission electron microscopy)
紙デジタル記事
A. Czerwinski, M. Pluska, J. Ratajczak 他<Z53-J286>Materials transactions52(3) 2011.3p.364～369
国立国会図書館全国の図書館
  • 要約等... in a scanning electron microscope (SE......g transmission electron microscope (ST......excited by the electron beam. The present investigati...
  • 参照...n transmission electron microscopy New approach t......endence of Nanoelectronic-Structure De......uminescence on Electron Beam Current I......Measurement by Electron Beam Induced C...... in a Scanning Electron Microscope

Effect of Pt substitution by Cu on structural and morphological changes in Fe-Pt nanoparticles during annealing as studied by in-situ transmission electron microscopy (Special issue on advances in electron microscopy for materials characterization)

Effect of Pt substitution by Cu on structural and morphological changes in Fe-Pt nanoparticles during annealing as studied by in-situ transmission electron microscopy (Special issue on advances in electron microscopy for materials characterization)
紙デジタル記事
Masatoshi Nakanishi, Gen-ichi Furusawa, Kokichi Waki 他<Z53-J286>Materials transactions48(10) 2007.10p.2572～2579
国立国会図書館全国の図書館
  • 要約等...<I>in-situ</I> electron diffraction and HREM observat...
  • 件名In-situ electron diffraction In......igh-resolution electron microscopy (HREM) observation FePt Fe(Pt...
  • 参照AC Impedance Measurement and Electron Holography of ......a Transmission Electron Microscope

大阪大学超高圧電子顕微鏡センター

大阪大学超高圧電子顕微鏡センター
紙雑誌
大阪大学超高圧電子顕微鏡センター[19--]-[2020]<Z74-L11>
国立国会図書館
  • 並列タイトル等（連結）Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
  • 並列タイトル等Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
  • 典拠情報（Author Heading/「を見よ」参照）Research Center for Ultra-High Voltage Electron Microscopy, Osaka University
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Material characterization using electron holography

Material characterization using electron holography
紙図書
Daisuke Shindo, Takeshi TomitaWiley-VCH[2023]<ND451-D17>
国立国会図書館全国の図書館
  • 内容細目...f Transmission Electron Microscopy Principles and...... Principles of Electron Holography Mic......ive Motions of Electrons and Their Int...... and Secondary Electron Distribution o......ive Motions of Electrons Around Variou......ive Motions of Electrons Theoretical C......ive Motions of Electrons Physical Cons......n Factors, and Electron Wavelength
  • 件名Electron holography Transmission electron microscopy Electron holography. Transmission electron microscopy.

In situ Lorentz microscopy and electron holography of magnetization process in ferrite magnets (Special issue on advances in electron microscopy for materials characterization)

In situ Lorentz microscopy and electron holography of magnetization process in ferrite magnets (Special issue on advances in electron microscopy for materials characterization)
紙デジタル記事
Toshiharu Aiso, Daisuke Shindo, Takafumi Sato<Z53-J286>Materials transactions48(10) 2007.10p.2621～2625
国立国会図書館全国の図書館
  • 要約等...ted by Lorentz microscopy and electron holography. By......a transmission electron microscope, th......tu</I> Lorentz microscopy. In the anisotropic Ba ferrit...
  • 件名ferrite magnet magnetization reversal magnetization process Lorentz microscopy electron holography
  • 参照Electron Holography Stu......y of Secondary Electron Distribution a......easurement and Electron Holography of ......a Transmission Electron Microscope

Interaction between magnetic domain walls and antiphase boundaries in Ni2Mn(Al,Ga) studied by electron holography and Lorentz microscopy (Special issue on advances in electron microscopy for materials characterization)

Interaction between magnetic domain walls and antiphase boundaries in Ni2Mn(Al,Ga) studied by electron holography and Lorentz microscopy (Special issue on advances in electron microscopy for materials characterization)
紙デジタル記事
T. Yano, Y. Murakami, R. Kainuma 他<Z53-J286>Materials transactions48(10) 2007.10p.2636～2641
国立国会図書館全国の図書館
  • 要約等...een studied by electron holography and Lorentz microscopy. This alloy co......tu</I> Lorentz microscopy observations have revealed th...
  • 件名... alloy Lorentz microscopy electron holography magnetic domains
  • 参照... in Dark-Field Electron Holography 透過電子顕微鏡を用いた局所領域の磁性...

High-resolution electron microscopy of stacking faults in heteroepitaxial ZnO/AiTaO3 (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

High-resolution electron microscopy of stacking faults in heteroepitaxial ZnO/AiTaO3 (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
紙記事
Sung-Hwan Lim, Daisuke Shindo<Z53-T76>Journal of electron microscopy51(-) (Suppl.) 2002p.S165～169
国立国会図書館全国の図書館
  • 件名high-resolution electron microscopy computer simulation ZnO stack...
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

High-Voltage Scanning Transmission Electron Microscopy : A Tool for Structural Characterization of Micrometer-Thick Specimens (Special Issue on New Trends for Structural and Chemical Analyses by Transmission Electron Microscopy)

High-Voltage Scanning Transmission Electron Microscopy : A Tool for Structural Characterization of Micrometer-Thick Specimens (Special Issue on New Trends for Structural and Chemical Analyses by Transmission Electron Microscopy)
紙デジタル記事
Kazuhisa Sato, Yuki Yamashita, Hidehiro Yasuda, Hirotaro Mori<Z53-J286>Materials transactions60(5):2019.5p.675-677
インターネットで読める国立国会図書館全国の図書館
  • 要約等...g transmission electron microscopy (STEM) as a tool for structur...
  • 件名high-voltage electron microscopy (HVEM) scanning transmission electron microscopy (STEM) dislocation indentatio...
  • 参照...o-High-Voltage Electron Microscopy Review of “12th Japanese-Poli...

In situ and ex situ electron microscopy studies of polar oxide surfaces with rock-salt structure (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

In situ and ex situ electron microscopy studies of polar oxide surfaces with rock-salt structure (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
紙記事
Marija Gajdardziska-Josifovska, Richard Plass, Marvin A. Schofield 他<Z53-T76>Journal of electron microscopy51(-) (Suppl.) 2002p.S13～25
国立国会図書館全国の図書館
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Transmission electron microscopy analysis of interfacial layers in Ti/Ta/Al ohmic contacts to n-AlGaN (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

Transmission electron microscopy analysis of interfacial layers in Ti/Ta/Al ohmic contacts to n-AlGaN (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
紙記事
Sung-Hwan Lim, Jack Washburn, Zuzanna Liliental-Weber<Z53-T76>Journal of electron microscopy51(-) (Suppl.) 2002p.S171～174
国立国会図書館全国の図書館
  • 件名high-resolution electron microscopy image simulations ohmic conta...
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Springer handbook of advanced catalyst characterization (Springer handbooks)

Springer handbook of advanced catalyst characterization (Springer handbooks)
紙図書
Israel E. Wachs, Miguel A. Bañares, editorsSpringer[2023]<PA51-D99>
国立国会図書館
  • 内容細目Vibrational Spectroscopy Electron and Photoelectron Spectroscopy Electron Microscopy Particle Scattering X-Ray Met...

Electron microscopy study on Mo content dependence of β to ω phase transformation due to cooling in Ti-Mo alloys (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)

Electron microscopy study on Mo content dependence of β to ω phase transformation due to cooling in Ti-Mo alloys (Eighth Conference on Frontiers of Electron Microscopy in Materials Science)
紙記事
Eiichi Sukedai, Hajime Matsumoto, Hatsujiro Hashimoto<Z53-T76>Journal of electron microscopy51(-) (Suppl.) 2002p.S143～147
国立国会図書館全国の図書館
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Transmission electron microscopy study on microstructure of Ag-based conductive adhesives (Special issue on lead-free and advanced interconnection materials for electronics)

Transmission electron microscopy study on microstructure of Ag-based conductive adhesives (Special issue on lead-free and advanced interconnection materials for electronics)
紙デジタル記事
Naoyuki Kawamoto, Yasukazu Murakami, Daisuke Shindo 他<Z53-J286>Materials transactions51(10) 2010.10p.1773～1778
国立国会図書館全国の図書館
  • 要約等We used advanced electron microscopy techniques to ......rs. Systematic microscopy observations revealed the dev...
  • 件名transmission electron microscopy conductivity measurement disc...
  • 参照...a transmission electron microscope II 溶接・接合プロセスとシステム化...

Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy (Recent Development in the Electron Microscopy of Semiconductors)

Control of island formation on silicon surfaces using ultra-high-vacuum scanning electron microscopy (Recent Development in the Electron Microscopy of Semiconductors)
紙記事
Yoshikazu Homma, Paul Finnie, Toshio Ogino<Z53-T76>Journal of electron microscopy49(2) 2000p.225～229
国立国会図書館全国の図書館
  • 件名scanning electron microscopy in situ imaging Si(111)-Au li...
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Observation and nucleation control of Ge nanoislands on Si(111) surfaces using scanning reflection electron microscopy (Recent Development in the Electron Microscopy of Semiconductors)

Observation and nucleation control of Ge nanoislands on Si(111) surfaces using scanning reflection electron microscopy (Recent Development in the Electron Microscopy of Semiconductors)
紙記事
Motoshi Shibata, Alexander A. Shklyaev, Masakazu Ichikawa<Z53-T76>Journal of electron microscopy49(2) 2000p.217～223
国立国会図書館全国の図書館
  • 件名scanning reflection electron microscopy Ge island Si(111) surface qua...
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Site-selective electronic structure of aluminum in oxide ceramics obtained by TEM-EELS analysis using the electron standing-wave method (Special issue on advances in electron microscopy for materials characterization)

Site-selective electronic structure of aluminum in oxide ceramics obtained by TEM-EELS analysis using the electron standing-wave method (Special issue on advances in electron microscopy for materials characterization)
紙デジタル記事
Yu Yamamoto, Kazuyoshi Tatsumi, Shunsuke Muto<Z53-J286>Materials transactions48(10) 2007.10p.2590～2594
国立国会図書館全国の図書館
  • 要約等...site-selective electronic structure an......TEM-EELS under electron channeling (standing-wave) co...
  • 件名electron channeling site-specific EELS...
  • 参照Energy Loss by Channeled Electrons: A Quantitati......rization Local electronic structure an......ve ELNES using electron channeling and......e materials by electron-channelling-en...... Site-specific electronic configuratio......s by channeled electrons Local atomic and electronic structures around Mg and Al...

Morphological analysis of cells by scanning electron microscopy (Special issue: Molecular electronics and bioelectronics)

Morphological analysis of cells by scanning electron microscopy (Special issue: Molecular electronics and bioelectronics)
デジタル記事
Yu Jin Kim, Hee-Dae kim, Chanhyuk Park 他<Z53-A375>Japanese journal of applied physics : JJAP47(2) (2) 2008.2p.1325～1328
インターネットで読める国立国会図書館全国の図書館
  • 件名fractal dimension analysis scanning electron microscopy cell

Studies on the structure of crescent-shaped GaAs quantum wires by combination of electron microscopy and photoluminescence spectroscopy (Recent Development in the Electron Microscopy of Semiconductors)

Studies on the structure of crescent-shaped GaAs quantum wires by combination of electron microscopy and photoluminescence spectroscopy (Recent Development in the Electron Microscopy of Semiconductors)
紙記事
Hirofumi Matsuhata, Xue-Lun Wang, Matsuo Ogura<Z53-T76>Journal of electron microscopy49(2) 2000p.349～355
国立国会図書館全国の図書館
  • 出版者（掲載誌）Oxford : Published for the Japanese Society of Electron Microscopy by Oxford University Press

Compendium of surface and interface analysis

Compendium of surface and interface analysis
紙図書
editor, The Surface Science Society of Japan.Springer[2019]<MC93-B28>
国立国会図書館
  • 要約等...ses, and their electronic/geometric st......ces in optics, electronics, and quantum beams. This b...
  • 内容細目Acoustic Microscopy Action Spectro......ure X-ray Photoelectron Spectroscopy A......traviolet Photoelectron Spectroscopy A......croscope Auger electron spectroscopy C......e Atomic Force Microscopy Differential I......rence Contrast Microscopy/Phase-Contrast Microscopy Dynamic Second......l Atomic Force Microscopy Electrochemica......ning Tunneling Microscopy Electrochemica......l Transmission Electron Microscopy Electrochemica......cal X-ray Photoelectron Spectroscopy Electron Backscatter Diffraction Electron Energy Loss Spectroscopy Electron Probe Microanalysis Electron Stimulated Desorption Electron-beam-induced current Ellipsom...
  • 件名...s) Thin films. Microscopy. Surfaces (Technology)

Quantitative electron holographic analysis of electric potential distribution around FEG-emitters (Special issue on advances in electron microscopy for materials characterization)

Quantitative electron holographic analysis of electric potential distribution around FEG-emitters (Special issue on advances in electron microscopy for materials characterization)
紙デジタル記事
J. J. Kim, W. X. Xia, D. Shindo 他<Z53-J286>Materials transactions48(10) 2007.10p.2631～2635
国立国会図書館全国の図書館
  • 要約等By means of electron holography, th......t quantitative electron holographic an......ts obtained by electron holography with those of the ...
  • 件名field emission gun (FEG)-emitter electric field electron holography
  • 参照Analytical Electron Microscopy for Materials Science Electron holography for......nomaterials by Electron Holography Electron holography of ......posite magnets Electron holography of ......agnetic fields Electron emission chara......stics of ZrO/W electron sources with a wide range of ...